RXT-6402 Dual 400G Multi-service Test Module
Advanced 400GE Test Module, for RXT-1202 Modular Test Platform, in portable hand-held form factor for Field Applications
VeEX® RXT is the industry’s most flexible, compact, and future-proof handheld test solution for transport, core, datacenter, metro, and access. The RXT-6402 Dual 400G all-in-one offers the flexibility of testing all interfaces and rates and future expandability for applications including Transport, Metro, Aggregation, Datacenter inter/intra/cross-connect, Cloud computing, 5G backhaul, and NEMs.
- 400G Down to 10M Ethernet Testing
- eCPRI, CPRI & OBSAI
- Fibre Channel
- OTN, SDH/SONET, PDH/DSn
Module Highlights
The RXT-6400 family has been the leading test solution for portable 400G testing, with the RXT-6402 expanding its applications and flexibility. Equipped to support all common optical transceiver form-factors, AOCs and DACs, this module is a perfect complement to the RXT Platform, extending its testing range to form <10M to 400 Gbps and offering a future upgrade path for a single all-in-one 400GE multi-service tester. Installation, verification, commissioning, evaluation, and maintenance tasks are simplified thanks to a combination of intuitive GUI and powerful test functions. Novice users benefit from the easy-to-use GUI, while experienced users will appreciate an array of advanced layer 1-to-4 features, such as FEC codeword Error distribution analysis, PAM4 pre-emphasis, skew, transceiver check and stress, Lane BERT, Throughput test, IPv4/IPv6 and much more.
General
- Up to four concurrent and independent tests
- Dual 400G Ethernet testing capabilities.
- Native QSFP-DD, QSFP56 and SFP-DD PAM4 hardware for best-in-class signal integrity (no adapters required).
- Provides all the necessary features to test all common form factors, including QSFP-DD, QSFP56, SFP-DD transceivers, DAC, AOCs, fan-out, networking equipment and 400GE links.
- Advanced and flexible state-of-the-art FPGA-based design provides future-proof hardware support for emerging standards, test functions and applications.
- Wide range of supported 400GE interfaces.
- I2C/MDIO registers Read and Write.
- Per-lane PAM4 pre-emphasis settings.
- KP4 FEC codeword symbol errors distribution and Skew.
- Transceivers power consumption monitoring (voltage, current) and variable voltage supply.
- Internal and external (cage) QSFP-DD temperature monitoring.
- High-efficiency intelligent cooling system
- Dedicated QSFP-DD head cooling fans (field replaceable) to extend the transceivers’ lifespan.
Applications
- Bring-into-service, verification and troubleshooting of high-speed Ethernet links.
- Optical transceivers, DAC, AOC and fan-out verification.
- Evaluation labs and field support
- Comprehensive test applications for layers 1-to-4, from 10M to 400GE.
- Full rate 400GE Throughput and frame loss measurements.
- PCS & RS-FEC layer testing.
- PAM4 signal integrity testing with multi-lane unframed BERT.
- I2C/MDIO verification and programming.
- Advanced optical transceiver test.
- Support for legacy and complementary transmission technologies
- Portable for field testing, evaluations, demonstrations, interop check, benchmarking, troubleshooting, link verification, etc.
- Battery power for mobility within large datacenters, nodes, Cos, R&D and evaluation labs.
Test Interfaces
- 2x QSFP-DD (PAM4)
- 2x QSFP56/QSFP28/QSFP+ (PAM4/NRZ)
- 2x SFP-DD/SFP56/SFP28 (PAM4/NRZ)
- 2x SFP+/SFP (NRZ)
- 2x RJ45
- 1x RJ48 and 3x SMA (legacy)
- 2x Clock Inputs and 2x Outputs
Advanced Optical Transceiver Test Suite
- Pre-FEC BER validation on a per-lane basis, over operational voltage and frequency offset range to verify optical module integrity before FEC is applied to the PAM4 signal (400GE interfaces).
- Pre-Framed BER (Lane BERT) validation for non PAM4 interfaces.
- Voltage, temperature, and Pre-FEC BER are monitored and displayed for the duration of the test. A histogram function clearly displays all three measurements for easy correlation and tracking of any abnormal changes.
- Pre-FEC BER and Optical Power threshold settings for PASS/FAIL indication.
- Pre-emphasis: Pre-taps, post-taps, and attenuation settings for PAM4 signal conditioning on the host side to help verify and stress transceiver tolerance and performance.
- Supply Voltage Tolerance Verification: Sweep range from 3.135V to 3.465V (3.300V +/- 5%) to verify compliance with optical transceiver MSA standard.
- Power Consumption Verification: Monitors the optical transceiver’s power consumption (Watts), to verify conformance to its specified power class.
- Temperature Monitoring: QSFP-DD module and cage temperature monitoring with built-in shutdown protection of the optical module if the temperature increases beyond a certain high temperature.
- Frequency Tolerance Verification: Sweep range from -100 ppm to +100pm (in 0.1ppm/step), to verify compliance with the 400GE IEEE 802.3 +/- 20 ppm tolerance specification.
- I2C Baud Rate Sweep: QSFP-DD and OSFP sweep range 100K to 4000K. QSFP28 sweep range (20K to 1000K).
- Stress Test: Pre and Post-FEC Test Suite
- MDIO Read/Write
- Optical Power Measurement
- Transmit Clock Sources
- Line Frequency Offset Generation and Measurement Capabilities
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